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Patents and Certificates

No. Classification Patent name Note
18 [Domestic] Connector and a method of manufacturing the semiconductor device test socket (Patent) (Patent)
17 [Domestic] Contactor and a method of manufacturing the semiconductor device test socket using a cantilever stru
16 [Domestic] The elastic function of the probe card and the method for producing the beam structure (Patent)
15 [Domestic] The probe tip of the probe card processing methods (Patent)
14 [Domestic] Assembly structure of a probe card (Patent)
13 [Domestic] The probe card of the needle using a microfabrication technology, a method of manufacturing the same
12 [Domestic] Probe needles of the probe card structure and a method of manufacturing the same (Patent)
11 [Domestic] A probe card and a manufacturing method (Patent)
10 [Domestic] Multi-cantilever beam structure and a method of manufacturing a probe card (Patent)
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